As you know, new-type corona virus (COVID-19) issue is now in severe situation. We decided to cancel the symposium on 13rd March.
About this Symposium
It is the second symposium in Japan about reliability issues related to electronics such as soft errors, aging degradations to threaten our safety, which consists of the keynote and several invited talks by distinguished researchers from all over the world. The first symposium was held in 2018, which was a great success. See here for details.
NOTE: Live streaming will be available for registered people who worry about Coronavirus.
We decided to cancel the symposium.
It is the second symposium in Japan about reliability issues related to electronics such as soft errors, aging degradations to threaten our safety, which consists of the keynote and several invited talks by distinguished researchers from all over the world. The first symposium was held in 2018, which was a great success. See here for details.
NOTE: Live streaming will be available for registered people who worry about Coronavirus.
We decided to cancel the symposium.
| General and Program Chair | Prof. Kazutoshi Kobayashi (Kyoto Institute of Technology) |
| Date & Time | 12:30-18:15, Friday, March 13th, 2020 canceled |
| Venue | 60th Anniversary Hall, Kyoto Institute of Technology,
Matsugasaki, Sakyo-Ku, Kyoto, 606-8585 Japan |
| Registration | Advance Registration is recommended. Please register from the banner below. |
| Registration Fee | Free of charge except for Reception |
| Reception | Regular : JPY3,000- / Student : JPY1,000- canceled |
| Sponsor | Green Innovation Lab, Kyoto Institute of Technology |
| Cooperation | - Consortium for "Quantum Innovation for Safe, Secure, Smart Society (QISS)" supported by JST OPERA.
- IEEE SSCS Kansai Chapter - IEEE SSCS Japan Chapter - IEEE EDS Kansai Chapter - 165 Research Committee in Japan Society for the Promotion of Science |
| Language | English |
Invited Speakers
- Dr. Philippe Roche (STMicroelectronics, France)
"New Radiation Paradigms in Space 2.0 and Vision Automotive in both FDSOI and FinFET" - Prof. Bharat Bhuva (Vanderbilt University, USA)
"Single-event mechanisms for bulk FinFET nodes" - Dr. Dimitri Linten (IMEC, Belgium)
"ESD Challenges in Advance FINFET and GAA Nanowire CMOS Technologies" - Dr. Michael C Trinczek (TRIUMF, Canada)
"Using TRIUMF's Beam Facilities for Radiation-Effects Testing" - Prof. Subhasish Mitra (Stanford University, USA)
"Robust Computing Systems: From Today to the NanoSystems Era"
Program
| 12:30-12:40 | Opening Prof. Kazutoshi Kobayashi (Kyoto Institute of Technology, Japan) |
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| Session 1 | Chair: Prof. Kazutoshi Kobayashi (Kyoto Institute of Technology, Japan) | |
|---|---|---|
| 12:40-13:40 | Invited Talk 1 Prof. Subhasish Mitra (Stanford University, USA) "Robust Computing Systems: From Today to the NanoSystems Era" |
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| 13:40-14:40 | Invited Talk 2 (Online Presentation) Dr. Dimitri Linten (IMEC, Belgium) "ESD Challenges in Advance FINFET and GAA Nanowire CMOS Technologies" |
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| 14:40-14:55 | Break | |
| Session 2 | Chair: Prof. Shigetaka Kumashiro (Kyoto Institute of Technology, Japan) | |
| 14:55-15:55 | Invited Talk 3 (Online Presentation) Prof. Bharat Bhuva (Vanderbilt University, USA) "Single-event mechanisms for bulk FinFET nodes" |
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| 15:55-16:55 | Invited Talk 4 (Online Presentation) Dr. Philippe Roche (STMicroelectronics, France) "New Radiation Paradigms in Space 2.0 and Vision Automotive in both FDSOI and FinFET" |
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| 16:55-17:10 | Break | |
| Session 3 | Chair: Dr. Taiki Uemura (Samsung Electronics, Republic of Korea) | |
| 17:10-18:10 | Invited Talk 5
Dr. Michael C Trinczek (TRIUMF, Canada) "Using TRIUMF's Beam Facilities for Radiation-Effects Testing" |
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| 18:10-18:15 | Closing Dr. Taiki Uemura (Samsung Electronics, Republic of Korea) |
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| 18:15-18:30 | Break | |
| 18:30-20:30 | Reception canceled |
Contact
Prof. Kazutoshi Kobayashi (Kyoto Institute of Technology)
serintconf2020@vlsi.es.kit.ac.jp
serintconf2020@vlsi.es.kit.ac.jp
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