The first symposium in Japan about reliability issues related to electronics such as soft errors, aging degradations to threaten our safety, which consists of the keynote and several invited talks by distinguished researchers from all over the world.
Date& Time 13:10-17:40, Monday, March 19th, 2018
Venue 60th Anniveary Hall, Kyoto Institute of Technology,
Matsugasaki, Sakyo-Ku, Kyoto, 606-8585 Japan
Registration Advance Registaration is recommended.(Registration closed)
You can be absent without any notification. But if you register the reception
and do not attend it, please tell us by e-mail (
Registration Fee Free of charge except for Reception
Reception Regular: JPY5,000- / Student: JPY3,000-
General and Program Chair Prof. Kazutohi Kobayashi (Kyoto Insititute of Technology)
Sponsor Green Innovation Center, Kyoto Institute of Technology
Cooperation ・Consortium for "Quantum Innovation for Safe, Secure, Smart Society (QISS)"
 supported by JST OPERA
・IEEE SSCS Kansai Chapter
・IEEE SSCS Japan Chapter
・The 165th Committee on Ultra Integrated Silicon Systems, the Japan Society
 for the Promotion of Science (JSPS)
Language English
Flyer in Japanese PDF

Keynote and Invited Speakers

Presentation Files

Presentation Files will be uploaded just before the symposium from here.

Final Program

13:10-13:20 Opening & Introduction

 Prof. Kazutohi Kobayashi (Kyoto Insititute of Technology, Japan)

13:20-14:30 Keynote Speech

"The Interaction of Security and Reliability in the Deep-nanometer Age" by
 Dr. Charles Slayman (Cisco Systems, Inc, USA)
 Chair: Prof. Kazutohi Kobayashi (Kyoto Insititute of Technology, Japan)
14:30-14:50 Break
Session 1
 Chair: Dr. Taiki Uemura (Samsung Electronics, Korea)
14:50-15:25 Invited Talk 1

"Silicon Odometers: Past, Present, and Future" by
 Prof. Chris Kim (University of Minnesota, USA)
15:25-16:00 Invited Talk 2

"SRAM Soft Error Rate - Technology Trends and Measurement Techniques." by
 Dr. Frank Schlaphof (GLOBALFOUNDRIES, Germany)
16:00-16:20 Break
Session 2
 Chair: Prof. Shigetaka Kumashiro (Kyoto Insititute of Technology, Japan)
16:20-16:55 Invited Talk 3

"Improving Energy Efficiency and Resilience of Electronic Products by Static and Dynamic Compensation Schemes" by
 Dr. Souhir Mhira in the proxy of Dr. Vincent Huard (STMicroelectronics, France)
16:55-17:30 Invited Talk 4

"Reliability Issues and Radiation Effects on Emerging Non-volatile Memories" by
 Prof. Jinshun Bi (Institute of Microelectronics of Chinese Academy of Science, China)
17:30-17:40 Closing
18:00-20:00 Reception


Prof. Kazutohi Kobayashi (Kyoto Insititute of Technology)