The first symposium in Japan about reliability issues related to electronics such as soft errors, aging degradations to threaten our safety, which consists of the keynote and several invited talks by distinguished researchers from all over the world.
| Date& Time | 13:10-17:40, Monday, March 19th, 2018 |
| Venue | 60th Anniveary Hall, Kyoto Institute of Technology, Matsugasaki, Sakyo-Ku, Kyoto, 606-8585 Japan |
| Registration | You can be absent without any notification. But if you register the reception and do not attend it, please tell us by e-mail (serintconf2018@vlsi.es.kit.ac.jp). |
| Registration Fee | Free of charge except for Reception |
| Reception | Regular: JPY5,000- / Student: JPY3,000- |
| General and Program Chair | Prof. Kazutohi Kobayashi (Kyoto Institute of Technology) |
| Sponsor | Green Innovation Center, Kyoto Institute of Technology |
| Cooperation | ・Consortium for "Quantum Innovation for Safe, Secure, Smart Society (QISS)" supported by JST OPERA ・IEEE SSCS Kansai Chapter ・IEEE SSCS Japan Chapter ・The 165th Committee on Ultra Integrated Silicon Systems, the Japan Society for the Promotion of Science (JSPS) |
| Language | English |
| Flyer in Japanese |
Keynote and Invited Speakers
- Dr. Charles Slayman (Cisco Systems, Inc, USA)
- Dr. Souhir Mhira in the proxy of Dr. Vincent Huard (STMicroelectronics, France)
- Dr. Frank Schlaphof (GLOBALFOUNDRIES, Germany)
- Prof. Chris Kim (University of Minnesota, USA)
- Prof. Jinshun Bi (Institute of Microelectronics of Chinese Academy of Science, China)
Presentation Files
Presentation Files will be uploaded just before the symposium from here.
Final Program
| 13:10-13:20 | Opening & Introduction Prof. Kazutohi Kobayashi (Kyoto Institute of Technology, Japan) |
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| 13:20-14:30 | Keynote Speech "The Interaction of Security and Reliability in the Deep-nanometer Age" by Dr. Charles Slayman (Cisco Systems, Inc, USA) Chair: Prof. Kazutohi Kobayashi (Kyoto Institute of Technology, Japan) |
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| 14:30-14:50 | Break | |
| Session 1 Chair: Dr. Taiki Uemura (Samsung Electronics, Korea) |
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| 14:50-15:25 | Invited Talk 1 "Silicon Odometers: Past, Present, and Future" by Prof. Chris Kim (University of Minnesota, USA) |
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| 15:25-16:00 | Invited Talk 2 "SRAM Soft Error Rate - Technology Trends and Measurement Techniques." by Dr. Frank Schlaphof (GLOBALFOUNDRIES, Germany) |
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| 16:00-16:20 | Break | |
| Session 2 Chair: Prof. Shigetaka Kumashiro (Kyoto Institute of Technology, Japan) |
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| 16:20-16:55 | Invited Talk 3 "Improving Energy Efficiency and Resilience of Electronic Products by Static and Dynamic Compensation Schemes" by Dr. Souhir Mhira in the proxy of Dr. Vincent Huard (STMicroelectronics, France) |
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| 16:55-17:30 | Invited Talk 4 "Reliability Issues and Radiation Effects on Emerging Non-volatile Memories" by Prof. Jinshun Bi (Institute of Microelectronics of Chinese Academy of Science, China) |
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| 17:30-17:40 | Closing | |
| 18:00-20:00 | Reception | |
Contact
Prof. Kazutohi Kobayashi (Kyoto Institute of Technology)
serintconf2018@vlsi.es.kit.ac.jp
serintconf2018@vlsi.es.kit.ac.jp
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